I want to take measurements for the I-V characteristic in resistivity calculation of metal oxide thin films. Can I do this using a potentiostat, especially in a solution-free environment, with two electrode connections? If possible, which technique should be used (for example, pulse voltametry, etc.). Thanks in advance.
Osman Kahveci I have only used 4-point probes for measurement of the resistivity of thin films (most often on ITO). I know that there are issues with 2-point methods but these are out of my experience. The attached document may be if use as will a bigger literature search (on RG or Google Scholar). For example:
https://www.researchgate.net/post/How-to-calculate-the-sheet-resistance-using-the-resistivity-obtained-by-the-4-point-technique
Better not try with 2-probe, cause you do not have control over contact resistance between thin film and electrodes. 4-probe is designed to overcome this contact resistance as well as arbitrary geometry of thin film surface
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