Usually finding the sample position in bright field is easy but when we change the microscop to the spectroscopy setting, my sample got lost. Does anybody has a solution for this problem?
The (Raman? IR?) microprobe systems normally are aligned to match the crosshairs in bright field viewing with the laser spot in spectral mode. Do you have a test sample of some kind that might help you find the location of the laser spot (edge of a Si wafer, for example).