Up to what size are single EBSD scans being done in literature? What is the limit? Are there any papers specifically discussing this?
Thanks!
I have developed a specific mapping technique (more advanced than the combo scan option of EDAX) with Stefan Zaefferer at Max-Planck Institute fuer Eisenforschung. I have covered over 6250 x 140 micron-square area. This data-set was used in my PhD-thesis, and the mapping-technique has been published in journal papers, all of which can be found at:
Article Statistical Reliability of Phase Fraction Determination Base...
Article Improving the Reliability of EBSD-Based Texture Analysis by ...
https://doi.org/10.1017/S1431927615010922
https://core.ac.uk/download/pdf/36587520.pdf
Using the beam only; and using the inherent PC correction of EDAX the maximum y-distance I can get was 140 microns. The limit of the x-axis is the size of your specimen, the stage-limit of the SEM and also the size of the data (when you try to collect larger data-sets, the software sometimes crash).
The article I shared, discusses the special mapping technique, which also can help to minimize distortion errors, since your repeat I fine area scan with a fine step size over a larger area, and use a auto-focus algorithm to correct for focus changes.
For example in this brochere 1x2.5 cm map is reported. https://www.azonano.com/article.aspx?ArticleID=3793
Thanks for the answers!
This is all quite interesting, how well do people characterize/correct for distortions which appear at these large area EBSD scans? I'm referring e.g. to trapezium distortion, large shift of pattern center, etc...
A student of mine recently did 2 x 2 cm ESBD scan on electrical steel. But using large step size for sure. However, I told him that was a waste of EBSD time.
Farangis, the PC correction by Vendor software which you talk about, what Vendors have this software?
Alternatively, is there any literature on the effect of using wrong PC on absolute orientation measurements? If I do a quick calculation using the work of Alkorta (Article Limits of simulation based high resolution EBSD
), a 300um scan with detector pixelsize of 30um, will give uncertainties of aprox 1 degree in crystal orientation, but that's for simulation based HR-EBSD.- Badges
- Science method