Nowhere do you say what you’re measuring and the sample preparation route for TEM. You get a number distribution from TEM. The standard error (of the mean) is proportional to the reciprocal of the square of the number of particles counted. For 1% standard error you’ll need to measure 10000 particle; for 10% SE, you can measure 100 particles. Remember too that you are imaging a tiny fraction of the sample so showing representativeness will be difficult - in the whole history of electron microscopy no more than a few tens of grams have been imaged. Also consider you’re looking at a slice through the particle (think of slicing a cube in different directions) and interpretation is difficult. Measuring a diameter without automation is also not easy. Automatic image analysis is one possibility.
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