I made evaporated Cr/Au patterns through lift-off process on silica on Si.
Then, I sputtered Cr on the wafer and pattered the Cr layer for SiO2 dry etch mask formation.
Cr/Au was for heater on silica waveguide, and etched trench was for thermal isolation between waveguides.
After SiO2 etch process, Cr etchant did not remove completely the Cr hard mask on Au layer.
On the other hand, Cr on SiO2 was removed without problem.
The residual Cr was confirmed by measuring the surface profile, showing ~100nm thickness.
Has anyone experienced something similar?