Scanning probe microscopy (SPM) is an exciting family of techniques applied to everything from materials science to biology. It is defined by the Royal Microscopy Society as “a family of techniques… a physical probe is positioned within a few nanometres of the surface, or in contact with the surface, and the probe is raster-scanned across the surface. A physical property of the surface, to which the probe is sensitive, is used as a control parameter to yield a true 3-dimensional image of the surface.” Through this definition we can see that SPM can cover a wide range of techniques designed to investigate a variety of properties including electrical and electrochemical properties, thermal properties, magnetic properties and more.

SPM is, however, often narrowed to focus only on Atomic Force Microscopy (AFM). To do so seems to limit the full toolkit available when all SPM techniques are considered. By narrowing our focus only to AFM we forget about all of the SPM techniques which allow us to characterize samples in ways not possible with AFM. Take Scanning ElectroChemical Microscopy (SECM) as an example. Using SECM we can measure the local electrochemical activity of a sample with chemical selectivity, as well as the local impedance of a sample. These sorts of measurements are intrinsic to the technique allowing it to answer questions which may have been closed off to AFM alone.

Is it too limiting to only consider AFM when discussing SPM? What SPM techniques deserve to be discussed more?

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