I deposited a very thin(~2nm) TiO2 film on Si substrate by magnetron sputtering. After that i did XPS of this film at room temperature and got following spectra. Can anyone know why an extra peak comes (~449ev) ?
Generally, Konstantin I. Maslakov has a point about X-ray satellites, that would indeed be the hottest candidate here.
Be careful with the C1s correction, you may create more errors than you fix. If you used conductive Si, not shifting your data for a properly grounded sample might actually be better, see works by Greczynski et al.:
Article Toward an increased reliability of chemical bonding assignme...
Article X-ray photoelectron spectroscopy of thin films