edx in TEM have sample in solution only is its and if in SEM what about the state of sample ?
Your question does not make complete sense. Perhaps you could reword it to make it clearer? However, trying to guess your meaning... At no point should the sample be in solution in either TEM or SEM. Liquids and vacuums do not mix!
For EDX the requirement of a sample is that it is perfectly flat, ideally polished to 1/4 micron grade; horizontal with respect to the incident beam; homogeneous within the interaction volume (dependent on mean atomic number of sample and energy of beam); non porous; conductive; solidly mounted and stable under the incident excitation energy. Any deviation from these conditions will degrade your results.
I assume you used something like google translation. I recommend to formulate simple sentences. The you as well as google perhaps translate it correctly.
As Ian already pointed out, there are many requirements. I only want add that the necissity of a horizontal plane is not that dramatic anymore since quite accurate correction terms are implemented in software packages. The major question is: do you need EDX quantitatively or only qualitatively? And: there are several books about X-ray analysis in scanning electron microscopes or microprobes (Goldstein, Reimer etc.). There are all basics well explained in a quality we won't be able to deliver here in such a forum.
EDX will give you elemental information,
If you want chemical information, go for XPS
If you want information about density of states, go for EELS or XANES
Energy dispersive X-ray spectroscopy is a chemical microanalysis technique used in conjunction with SEM and is not a surface science technique.The EDS technique detects x-rays emitted from the sample during bombardment by an electron beam to characterize the elemental composition of the analyzed volume.The number and energy of the x-rays emitted from a specimen can be measured by an energy dispersive spectrometer. As the energy of the x-rays is characteristic of the difference in energy between the two shells, and of the atomic structure of the element from which they were emitted, this allows the elemental composition of the specimen to be measured.
The accuracy of the spectrum can also be affected by the nature of the sample. X-rays can be generated by any atom in the sample that is sufficiently excited by the incoming beam. These X-rays are emitted in any direction, and so may not all escape the sample. The likelihood of an X-ray escaping the specimen, and thus being available to detect and measurement depends on the energy of the X-ray, the amount and density of the material it has to pass through
@Jyoti Mayekar :
Please, do not give wrong advice. EDS detector could be attached to SEM, TEM, X-ray tube...
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