Hello everyone!
I need to detect the concentration of Li impurity in ZnO:Li films (about 120 nm thickness). They are e-beam deposited using 10% and 1% target hubs, but I need to identify the amount now in films. These are metal-oxide-metal structures containing ZnO:Li film, such as LaB6/ZnO:Li/Ag and SnO2:F/ZnO:Li/Ag. The SEM microscope of our institution is only able to detect elements with lower atomic mass than Li. And also no any other technologies, like XPS, XANEX, RBS, NRA are available in any institution of my country.
Is there chance anyone has a technical ability perform this analysis and detect Li percentage for me, if I send the samples?
That would be a great help if it's possible.
Thank you.
Try with XPS/XANES/ICP analysis. You will be able to detect the Li. ICP should be available easily. It gives the quantitative analysis.
ICP or XPS (ESCA) will certainly help you for quantitative analysis than other technique.
Good luck
Try with Rutherford Back Scattering (RBS) technique will certainly get the good results regarding the elemental concentration
Thanks for responses, but the problem is that in my country none of these methods like XPS, XANEX or RBS are available. That's why I would like to find some collaboration or someone who has access to such methods and can do that for me :)
The question to be answered are what the detection limits are for homogeneous Li distribution or inhomogeneous distribution. For the latter you will have to make a cross-section and either use EELS or windowless EDXS to detect the ionization edge at ~60eV. This is relative tricky and yo probably won't find anybody who will try this for free.
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