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I can not measure XRD of metal oxide thin films with Bruker Advance D8 diffractometer. I deposited my films both on Si and glass. When I try to measure XRD of thin films on Si, I get only Si...
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I have Cu2ZnSnS4 films on soda lime glass and Silicium wafer. I choose Si wafer for correct measurement of elemental analysis. In EDS analysis how can I ignore (or remove) Si from spectrum? Is it...
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Is there a measurement method for Fermi level for a semiconductor or heterojunction, i.e, semiconductor/metal oxide/metal.
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