What is the residual stress of such large composite materials prepared by CVD growing graphene on copper?
Residual stress in graphene-copper composites can be studied using X-ray diffraction (XRD) techniques. There are several methods that can be used to measure residual stress using XRD, including the sin2ψ method and the modified sin2ψ method.
The sin2ψ method involves measuring the XRD peaks for the graphene and copper phases separately, and then calculating the residual stress based on the peak positions and the known lattice parameters of the phases. This method is based on the fact that the peak positions of the diffraction patterns are affected by the residual stress in the material, and the shift in peak position can be used to calculate the residual stress.
The modified sin2ψ method is similar to the sin2ψ method, but it involves measuring the peak positions of the diffraction patterns for both the graphene and copper phases simultaneously. This method is more accurate than the sin2ψ method, but it requires more detailed analysis and may be more time-consuming.
To use XRD to measure the residual stress in graphene-copper composites, you will need to follow these general steps:
It is important to carefully follow the specific procedures and techniques for measuring residual stress using XRD, as the accuracy and reliability of the results will depend on the quality of the measurements and the correctness of the analysis. It may also be helpful to consult with experts or review the relevant literature to ensure that you are using the appropriate method and techniques for your specific materials and application.
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