I have few profiles from AFM image using "extract profile icon" of Gywddion software? 2,3,4,6 are profiles corresponding to (smaller lines on image) probably showing agglomerated nanoparticels and 1,5 corresponds to longer lines representing surface profile (of probably nanoparticles). Silicon wafer is polished.
Can you tell me about present nanoparticles size and distribution?
And where is control? I mean profile of clean substrate with no particles. Besides profiles images could be really useful.
You need to correlate this height profile and topography image. You know the shape of ur particles, if its round or cubic or any shape, this can be seen in ur topography image. now u have this height profile, The big peak height in the profile is ur particle height and peak width at the baseline is ur particle size. now make a statistical histogram with as many height profile as you can and plot particle size and particle number. try it out.. its really easy...
Thank you Prof. Dusevich and Chandan sir.... Please find extracted line profile of uncoated silicon oxide wafer in attachment..
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