Well its depends upon the spot size of the X-Ray as well as your sample mounting procedure. If you are going to use carbon tape then i would suggest to use enough powder to cover the entire tape. else you would get additional carbon (from the tape) in your spectra.. as well as it would give you false information.
Practically, for any type of the instrument is enough to have a few mg of the powder. About 5 - 10 mg is the maximum amount that will be used even for large spot XPS analysis.
Powder samples are not good for XPS analysis. If you make a pellet out of the powder and sinter it, it will work better. Powder particles are covered with adsorbed contaminants like carbon, oxygen etc. When it is in the form of pellet, you can remove contamination by scrapping the surface in UHV. Powder as such can not be cleaned in-situ. In any case, many people carry out XPS studies on powder samples. XPS signals are influenced by contamination. Your interpretation may be wrong if XPS is taken on powder as it is. If you have no option than doing on the powder, for usual XPS(no-monchromatic), X-ray spot size is about 5 to 10 mm, you should have enough powder to cover whole of this area. It cannot be mentioned in terms of mass, as it depends on the kind of sample you have.
kindly suggest if I want to prepare the sample for lyophilized bacterial culture for the analysis of surface of gram positive bacteria...........how can I prepare the sample ...........
Abhijit N Kadam , usually I take a snip of carbon tape ~3x5mm and place it onto the sample holder, then add just enough sample to cover the carbon tape at all. It's not hard to do it always when there is enough sample material and even better as long as it is not electrostatic.
Can thin films be used to record XPS. In that case what should be the minimum thickness of film to get a reliable XPS spectrum. What substrate is preferred to coat the film. Please share your thoughts. Can XPS be recorded for films that are very thin. Like 1 to 10 nm? Or thick films are needed?
Remember that XPS information depth is only a few nm. It depends on the KE of characteristic peak, but it never exceeds 10 nm. There are no limits for ultrathin films, because you can always use XPS at grazing collection angle to increase the surface sensitivity.