Assuming that we have analysed a sample with SEM-EDS. If the surface of the sample was not polished (or not polished very well), then it would not be very flat. I am curious how much this rough surface will affect the analysis results (for instance, the indication of elements, the intensity of peaks, etc)? Is there a possibility that the detector will receive the X-ray which is released from the region adjacent to the investigated region (because of the roughness of the surface)?
Think of the electron detector gun, sample, and detector as looking at yourself in a mirror. if you put your hands out in front of you, your body will be hidden. any large features which may produce an electron shadow will block your ability to scan certain areas...this can be resolved a bit by rotating the sample on the stage or trying to change the angle of reflection.
You must be sure the spot you analyze is not shielded from detector by other specimen features (easy to see by overall decrease of intensity). Change of peak intensities (especially for lighter elements) is possible, so quantification is not recommended. Localization may be somewhat compromised by spreading of backscattered electrons; detection of elements from close by region is possible as a minor peaks. Nevertheless, it is very usable technique for qualitative analysis when above mentioned problems are taken in consideration.
- Badges
- Science topic
- Similar topics
- Chemistry
- Biochemistry
- Biochemical Techniques
- Blotting Techniques
- Immunoblotting
- Dyes