Question 1: How could i explain changing FWHM, integral intensity etc.?
Question 2: What does it mean, when the angular position of all peaks are shifted (peaks are characteristic of one phase)?
Question 3: What does it mean, when the angular position of one peak is shifted (relative to the remaining peaks which are characteristic of single phase)?
Question 4: How can you see the texture on the XRD patterns?
It is XRD patterns of 3YS+5NFAl2O3+0.5SWCNT before and after beam irradiation.
Ekaterina Abdulmenova, I would suggest spending a few days with a book on the basics of the XRD. This can be beneficial for years, as good understanding of the principles will give you an important insight into limitations of the method and about reliability of such obtained results. I would recommend some of these titles:
- https://www.springer.com/la/book/9783642166341
- https://www.amazon.com/Elements-X-Ray-Diffraction-3rd-Cullity/dp/0201610914
some are even on RG: https://www.researchgate.net/profile/Ahmed_Hassanien/post/What_is_the_main_purpose_of_XRD_analysis_of_materials_How_it_is_different_from_EDS_analysis/attachment/59d64b9279197b80779a5988/AS%3A480622478139392%401491600736594/download/B.+D.+CULLITY-Elements+of+X-RAY+DIFFRACTION-SECOND+EDITION.pdf
Then, for the quick intro, you can also check one of the many hands-on tutorials floating around web, like: http://prism.mit.edu/xray/introduction%20to%20xrpd%20data%20analysis.pdf
You can consult the Scherrer formula to understand the relation between the coherent domain size (crystallite size) and FWHM. The crystallite size is inversely proportional to FWHM. The shifting of peak position indicating the the presence of lattice strain based on Williamson-Hall plot. Texture indicating the preferred orientation along particular plane. Texture coefficient can be calculated qualitatively ( Lotgering Factor (f) ) from the intensity of XRD pattern and the ICDD reference of the same phase. You can use GSAS-II software to calculate Tc quantitatively with 2D figures. You can find more about these topics here on RG platform as well as using google. Further, you need a good software such HSP to do your analysis.
https://subversion.xray.aps.anl.gov/pyGSAS/Tutorials/2DTexture/Texture%20analysis%20of%202D%20data%20in%20GSAS-II.htm
https://www.researchgate.net/post/How_to_calculate_Lotgering_Factor_from_XRD
* the FWHM of the peak is due to the stresses introduced into the matrix (example: insertion or substitution atoms that create deformation)
* peak displacement is due to the change in mesh parameters (may be a phenomenon of partial relaxation in the matrix)
* The change in peak intensity does not necessarily mean that this phase gains in proportion, but it is unlikely that there is a part of the surface that contains a proportion of this phase that is significantly higher than another part (inhomogeneity of the surface).
* We can have an idea about texture by EDX (SEM).
Mohammed M. Obeid
Hello Mohammed M. Obeid,
Thank you very much for your comments and recommend. This is very useful for me. I didn't know about Texture coefficient. Thank you for you told me, that I will able to be calculated qualitatively (Lotgering Factor) from the intensity. Tc is Texture coefficient, I right understand?
Djamel Belamri
Hello Djamel Belamri,
Thank you very much for your comments. That is, when the angular position of one peak is shifted (relative to the remaining peaks which are characteristic of single phase), it to change in mesh parameters (the example: lattice parameter cubic a=b=c =const, but after partial relaxation in the matrix a=b=const c- changing). I right understand?
Ekaterina Abdulmenova, I would suggest spending a few days with a book on the basics of the XRD. This can be beneficial for years, as good understanding of the principles will give you an important insight into limitations of the method and about reliability of such obtained results. I would recommend some of these titles:
- https://www.springer.com/la/book/9783642166341
- https://www.amazon.com/Elements-X-Ray-Diffraction-3rd-Cullity/dp/0201610914
some are even on RG: https://www.researchgate.net/profile/Ahmed_Hassanien/post/What_is_the_main_purpose_of_XRD_analysis_of_materials_How_it_is_different_from_EDS_analysis/attachment/59d64b9279197b80779a5988/AS%3A480622478139392%401491600736594/download/B.+D.+CULLITY-Elements+of+X-RAY+DIFFRACTION-SECOND+EDITION.pdf
Then, for the quick intro, you can also check one of the many hands-on tutorials floating around web, like: http://prism.mit.edu/xray/introduction%20to%20xrpd%20data%20analysis.pdf
(the example: lattice parameter cubic a=b=c =const, but after partial relaxation in the matrix a=b=const c- changing) !!!
in this case the first one is a cubic structure and the second one is another "quadratic" structure !!!! so we are not talking about the same structure (it is not the same DRX diffraction)
on the other hand, it may be a solid solution that keeps the structure but changes the distribution of these components.
Hello, Janez Zavašnik ,
Thank you very much for your comment. Thank you for recommending such cool books and hand-on tutorial. This will help me get results more competently! =)
Hello, Djamel Belamri ,
Thank you for answering my question and explaining my example! This is very useful for me! =)
To make it even better, I would suggest you to read the below book
Klug, H.P. and Alexander, L.E. (1974) X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials. 2nd Edition, Wiley, New York.
Additionally, please take a look at the link - http://www.icdd.com/index.php/methodfield-tutorials/
Hello, Husin Sitepu
Thank you very much for your recommending book and website on Industry/Application Tutorials. It is very useful information for me=)
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