the film is deposited by evaporating MAPbI3 taken in a Mo boat. and the thickness of the film was above 500nm. but when I took the XRD I got a different pattern as shown in figure and it is not matching with the XRD of powder perovskite.
Dear Pratheek Mekkat
The XRD results look like crystalline peak of carbon or only glass substrate suggesting MAPbI3 not properly deposited. Please check your physical vapour deposition method and SEM image also.
Penetration range of X rays varies from few to several microns. Here the deposited thickness is slightly above 0.5 microns, thus the background noise is obviously present.
Maybe if you collect an XRD spectra from your substrate only and compare it with the one you have collected with from a substrate and deposited film it will answer the question whether your spectra represent the XRD collected from the sample, from the film or a combination of the two.
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