Well, I usually use the most recent JCPDS cards and I take into account the XRD measurement conditions and the synthesis conditions used to prepare the material.

i prefer to use programme PC WIN PDF to analyze the XRD i it is online programme nd available in India.  it is good to find anything in XRD .

Firstly, you have not mentioned what type of compound or material you want to match. Secondly for what type of program do you use for XRD analysis? I mean if you have any such software with you then you can use search/match option in that and restrict your search with the elements present (if you know possibly what are the elements present) but that should be done after proper background removal or K-beta stripping (if the measurement was done without filtering off K-beta lines from source XRD). You should consider the 100% peak first then the subsidiary peaks from JCPDS which matches with the peak position. As I already said all depends upon the material if its a single or composed of many metals so before a proper answer it would be better if you could clarify these points.

Thankyou mam.

I am preparing NiMn thin film. i dont have any software with me. i have to index the peak .

you see the book by Cutily

contact CECRI/  IIT(M)

@Raji Sudha... Sorry for such a late reply. I hope you have solved your problem by now. If not then you can msg me in researchgate in my inbox for the reply. 

Ni and Mn should show different peaks initially. Once they form alloy their peak positions shifts depending upon the extent of alloying. Now you need to first prepare Ni and Mn separately under same conditions and find out which phase (CPDS No) matches with the mono-metallic films. Then analyse the bimetallic film and observe the peak shifting. You may calculate the extent of alloying using Vegard's Law.

I have calculated strain from XRD by using formula

strain= (beta*cos theta)/ 4

I dont know why we are using this 4 in this equation.

Is it correct sir.