I have a sample containing SiO2 as a substrate ,up on that 7 nm thickness of Fe and 0.4 nm thickness of Al2O3, expected there are nanoparticles of size range of less than 100nm ,basically interested to see the grain boundary, but I couldnot see any such features even in high magnification.
But I can get the signals from Fe and Al from the sample through EDS .
Dear Sharvani,
As you have mentioned your substrate thickness is 7 nm. Please use AFM(1 to 330 nm in solution phase also) to get clear surface image and measurements as well.
Use this site:
https://agupubs.onlinelibrary.wiley.com/doi/full/10.1029/2012WR012200?__cf_chl_captcha_tk__=2173e2bb40d127cde02a44e39413611affa2dbc5-1575617393-0-AX8NRQ6N_uzkJZzJV7laUTtVVxO_Wc3hmBSA60ebbCrnbqd8msXvG9jSE1NhvhXUNv0inaPlX6W7lSK6ZaKx7i1QZ9t5ax8aJQuGg0AXHkgLfGDSaA7WiKJMYJGLRY2dpfu1ylhld-iO0WW8WZ8K_d6-DCxePs8faT2DBopf4zJUDIAyj8v4BDvHvlIcnnM-LYUL0xi23nKeYstS7QFxj1pNuD77e7RSgdSitMhLa6dTBqdImeWTbtPUroSurLKv83UPO_t4C743GoioEbGdKzdRZ8GzpTwmcttFD5Dxc9Bp_XjNxuLwKwQMdNe24glEVVc-x77gX5FoC8A2sYo_nY85MFZqW2liPhjyDAbt-P--
7 no. reference.
Hope it help you out.
Dear Sharvani,
As you have mentioned your substrate thickness is 7 nm. Please use AFM(1 to 330 nm in solution phase also) to get clear surface image and measurements as well.
Use this site:
https://agupubs.onlinelibrary.wiley.com/doi/full/10.1029/2012WR012200?__cf_chl_captcha_tk__=2173e2bb40d127cde02a44e39413611affa2dbc5-1575617393-0-AX8NRQ6N_uzkJZzJV7laUTtVVxO_Wc3hmBSA60ebbCrnbqd8msXvG9jSE1NhvhXUNv0inaPlX6W7lSK6ZaKx7i1QZ9t5ax8aJQuGg0AXHkgLfGDSaA7WiKJMYJGLRY2dpfu1ylhld-iO0WW8WZ8K_d6-DCxePs8faT2DBopf4zJUDIAyj8v4BDvHvlIcnnM-LYUL0xi23nKeYstS7QFxj1pNuD77e7RSgdSitMhLa6dTBqdImeWTbtPUroSurLKv83UPO_t4C743GoioEbGdKzdRZ8GzpTwmcttFD5Dxc9Bp_XjNxuLwKwQMdNe24glEVVc-x77gX5FoC8A2sYo_nY85MFZqW2liPhjyDAbt-P--
7 no. reference.
Hope it help you out.
Thank you Mr.Ashish Thakur
But the deposited material on substrate is 0.7nm.it is the normal SiO2 substrate general y used for sample coating.
But in your question it is 7 nm thickness.
Your sentence:
How can I get good image of thin film of 7nm thickness on SiO2 substrate?
I have a sample containing SiO2 as a substrate ,up on that 7 nm thickness of Fe and 0.4 nm thickness of Al2O3, expected there are nanoparticles of size range of less than 100nm ,basically interested to see the grain boundary, but I couldnot see any such features even in high magnification.
Just rectify it. If you wish to ask question thickness of 0.7 nm, you must rectify it.
Ashish
If you want to use instrument to measure less than 0.2 nm thickness, go with another high precision instrument like spectroscopy ellipsometer(0.1 nm to 100 nm)
..
Change you question, instead of 7 nm say it is 0.7 nm.
Ashish
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