A resolution is correlate with roughness of thin film. I expected some like FWHM(2th) for XRD. It can be calculated from configuration of device. What's here?
Thank you, Chaitanya. I'm misunderstood. I don't need to improve the resolution of the device. I need to estimate it to take it into account.
Specifically, the GENX program uses additional Gaussian broadening. Is there a generally accepted method for calculating it like fundamental parameters in XRD?