We used to use SEM to characterize the samples prepared by us. In order to do this, we have to send our samples to somebody, get characterized, and let them send back. This takes weeks. To circumvent this bottleneck, now we are considering the possibility of using AFM instead of SEM. So my question is, can AFM do all the necessary things SEM can do?
Yes, you can still use AFM.
Several studies have been performed by AFM to characterize electrospun nanofibers, and please see the attached information for your reference.
AFM studies will clearly and vividly shown the drug incorporation process of blend-electrospun nanofibers (https://pubs.rsc.org/en/content/articlelanding/2012/ra/c2ra20146a#!divAbstract)
The other study used a combined atomic force microscopy (AFM)/optical microscopy technique to find out the mechanical properties electrospun (PCL nanofibers) (https://www.sciencedirect.com/science/article/pii/S0928493115304276)
All the best
-Sathish
Following Sathish's comments and suggestion, the instrument of a SEM can give some information that AFM can't such as the sizes (diameter and length) of nanotubes. AFM is normally for the roughness of a surface.
AFM offers multiple ways to characterize materials but there are limitations. If what you are studying is energy/battery material, this review paper might help you identify what kind of information you can glean from AFM.
Article Scanning probe microscopy based characterization of battery ...
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