Dears,
I have a question regarding X-ray photoelectron spectroscopy (XPS) analysis that I was hoping you could help me with. I'm curious about the possibility of determining the valence band energy of a material from its XPS survey spectrum. If this is indeed possible, I would greatly appreciate any guidance on how to accomplish this using Origin software, as I don't have access to CasaXPS. Could you please provide some insight into this process or suggest any alternative methods?
Thank you in advance for your time and expertise.
Hayet Lallali Yes, you can determine the valence band maximum (VBM) of a material from its X-ray Photoelectron Spectroscopy (XPS) survey spectrum using Origin software.
To prepare XPS survey data, import the spectral data into Origin, select the low binding energy region, apply baseline correction using Origin's Peak Analyzer tool, and determine the VBM by plotting the spectrum, identifying the leading edge, and performing linear extrapolation on the leading edge of the valence band spectrum. This helps estimate the binding energy at the intersection.
Given the likely acquisition parameters of the survey spectrum, the value you derive won't be accurate. You should work on high resolution data for these problems
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