I have taken the XRD patterns for epoxy polymer with and without fly ash content.
The intensity of XRD pattern is shifted towards the lower scattering angle value during the addition of fly ash.
Anybody can suggest the reason for this shifting in amorphous samples?
Rajkumar G.
Dear Dr.G.K.Sathishkumar,
Generally, we are not concern about the shifting in amorphous materials.
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Satish Kumar Agarwal
Dear Dr G K Satishkumar,
Generally, amorphous materials are non-crystalline in nature and no diffraction peak is detected in the XRD pattern of an amorphous material
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