The electrical conductivity of metal nanoparticles can be measured using various methods or instruments, depending on the specific requirements of the measurement. One commonly used method is the four-point probe technique, which involves passing a known current through the sample and measuring the voltage drop across the two inner probes. The electrical conductivity can then be calculated using the known dimensions of the sample and the measured values of current and voltage.
Another common method is the impedance spectroscopy technique, which involves measuring the impedance of the sample as a function of frequency. This method can provide information on both the electrical conductivity and the dielectric properties of the nanoparticles.
Other techniques that can be used to measure the electrical conductivity of metal nanoparticles include transmission electron microscopy (TEM), scanning tunneling microscopy (STM), and atomic force microscopy (AFM). These methods can provide high-resolution images of the nanoparticles and can also be used to probe the local electrical properties of the nanoparticles.