SEM,FTIR,DSC,TGA

Dear @Luo Zhi,

Here the important methods and techniques used to characterise materials:

Structural Characterization:

XRD - X-Ray Diffraction

TEM - Transmission Electron Microscopy

SEM - Scanning Electron Microscopy

SAXS - Small Angle X-Ray Scattering

Neutron Diffraction

Morphological Characterization:

AFM - Atomic Force Microscopy

STM - Scanning Tunneling Microscopy

HRTEM - High-Resolution TEM

Confocal Microscopy

Chemical Composition Analysis:

EDS/EDX - Energy Dispersive X-Ray Spectroscopy

XPS - X-Ray Photoelectron Spectroscopy

AES - Auger Electron Spectroscopy

FTIR - Fourier Transform Infrared Spectroscopy

Raman Spectroscopy

ICP-MS - Inductively Coupled Plasma Mass Spectrometry

Thermal Analysis:

DSC - Differential Scanning Calorimetry

TGA - Thermogravimetric Analysis

DTA - Differential Thermal Analysis

DMA - Dynamic Mechanical Analysis

Mechanical Testing:

Tensile Testing

Vickers/Rockwell/Brinell - Hardness Testing

Nanoindentation

Compression and Shear Testing

Electrical and Magnetic Characterization:

Four-Point Probe Measurement

Hall Effect Measurement

Dielectric Spectroscopy

MFM - Magnetic Force Microscopy

VSM - Vibrating Sample Magnetometry

Optical and Spectroscopic Analysis:

UV-Vis Spectroscopy - Ultraviolet-Visible Spectroscopy

PL - Photoluminescence Spectroscopy

Ellipsometry

Surface Analysis Techniques:

SIMS - Secondary Ion Mass Spectrometry

ToF-SIMS - Time-of-Flight Secondary Ion Mass Spectrometry

Contact Angle Measurement

Porosity and Surface Area Analysis:

BET - Brunauer–Emmett–Teller Analysis

Mercury Intrusion Porosimetry

Dynamic and In-Situ Analysis:

In-Situ XRD

ESEM - Environmental Scanning Electron Microscopy

In-Situ TEM

Synchrotron Techniques

To characterize what? The techniques are plenty and are choosen on the base of the parameters that you have to know of your materials

For Morphological studies, surface and particle size: SEM, TEM etc.

For structural, phase composition, crystallinity analysis: XRD

For chemical bonding and functional groups: FTIR, Raman etc.

For surface chemistry and Nano surface topography: XPS, AFM

for thermal analysis, TGA, DSC

for mechanical properties: UTM, hardness machines etc.