AES has become a practical and straightforward characterization technique for probing chemical and compositional surface environments and has found applications in metallurgy, gas-phase chemistry, and throughout the microelectronics industry . َAnd , Due to the large variation in ionization probabilities among different materials, SIMS is generally considered to be a qualitative technique, although quantitation is possible with the use of standards. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.

But I think for your question , It depends on your sample ,expenses and your goals .  It would be great if You brought a sample .

I am late with my answer but I hope it can help somebody. I have some comments I want to add to Mohammadreza's answer.

Auger electron microscopy has better lateral resolution (~10nm) compared to SIMS (~100nm).

Generally I would say that the use of SIMS or AES does not so much depend on the kind of sample you want to measure but more on the question you have.I have used both AES and TOF-SIMS on steel samples and Zn coatings and my conclusion is that SIMS is better for bulk analysis because the sensitivity is higher. For example I can see the carbon and boron distribution in steel only with SIMS because of the low concentration of some elements (for example C~0,03wt%, B~20ppm). Auger is better for realistic mappings because the measured amount does not depend so strong on the presence of oxygen or more general the peak height does not depend so stong on the matrix. At the surface I would generally prefer Auger because of the better lateral resolution and the better quantifiability.

With both methods you get some kind of chemical information but very different ones. With Auger you see peek shifts in the spectra similar to XPS and this can be used very well for identiying the oxidic states of elements. But Auger is useless for chemical state of organic carbon, you simply get a very broad peak without chemical information. SIMS on the other hand can be used for example to distinguish between oxides and hydroxides on top of a corroded sample. In hydroxide you measure OH- ions. SIMS can also be used for organic samples. You measure fragments of the large organic molecules with typical masses, so called fingerprints, and compare them to reference spectra.

TOF-SIMS has the advantage that it is faster than Auger because you measure all poisitive or all negative ions simultaneously.