The necessity of Omega (Ω), Chi (Ψ), and Phi (Φ) scans in grazing incidence X-ray diffraction (GIXRD) for thin films lies in their ability to provide comprehensive information about the crystalline properties of the film:
Omega (Ω) Scan: This scan involves tilting the sample around the axis perpendicular to the surface. It helps in determining the out-of-plane crystallographic orientation and phase identification.
Chi (Ψ) Scan: This scan involves tilting the sample around the axis parallel to the surface. It provides information about the in-plane crystallographic orientation and can help identify texture or preferred orientation of the crystallites.
Phi (Φ) Scan: This scan involves rotating the sample around the axis perpendicular to the beam direction. It is used to study the azimuthal dependence of diffraction, which can reveal information about the symmetry and anisotropy of the crystal structure.
Actually, is it clear that the Chi scan is the rotation of the sample about the axis through the sample plane, whereas the phi scan is the rotation of the sample about the axis perpendicular to the sample, whereas the omega is the tilting of the sample about the Bragg angle or angle of incidence of X-ray with the diffraction plane.
Now the texture of the thin film can be in an out-of-plane or in-plane direction, so can you clarify the scan preference?