I made some Metal Oxides thin films by spin coating a solgel solution on a substrate but don't have grazing incidence XRD at my disposal. Is it reasonable to dry the gel solution, treat it thermally as the film and then use the so-prepared powders to determine the crystalline phase?
The result will be different. Powder samples mostly give more number of peaks than the thin films. So if you want to characterize the powder and use that data for thin films analysis, your result will be different. You can see the result difference in the Cu doped ZnO samples we have prepared.
No, it's not reasonable, but the XRD pattern of the so-prepared powders can help you to find the location of some crystalline faces in XRD pattern of the thin film.
It is not clear what films of a nano, mezo, usual at you. If they are oxide, then oxides are resistant to heat. If these are hydroxides, they can form agglomerates during sintering. No films are needed to study the crystal structure of XRD. They still need to be dispersed into powder. For the exact answer to your question you need more information.
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