I would like to measure the chemical content of a gear surface to a depth of 1 mm. But there is a problem because the x-ray photoelectron spectroscopy (xps) method that I will use can only reach depths of a few nano.
Is there a possible method in spectroscopy to analyse the chemical content layer by layer of a metal up to a few millimetres thick?
XPS is a pure surface analysis technique, limited to at most 50 nm depth. One could use Scanning Electron Microscopy (SEM) that can potentially provide depth analysis in the range of a micron of so (depending on how one uses backscattering vs. secondary electron and also depending on the electron wavelength used that is set by the applied voltage).
As for a depth profile of few mm, in case if one can cleave the edge of the same, then one may be able to use high resolution SEM applied across the sample thickness to explore possible way to distinguish between chemical makeup of the sample, but this is no longer non-destructive approach.
If the material is transparent/translucent you could profile it with confocal Raman microscopy.
Thank you for your suggestions.
This sample is made of steel, which if cut each layer into a new surface for measurements up to 1 mm, it will certainly affect the microstructure due to heat and cutting force.
I thought of taking a side view of the sample surface. Then shoot a beam at the surface and shift the incident beam for each layer in micrometer steps. I don't know yet if these incident rays are smaller in diameter or equal to a few micrometers in size?
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