While collecting XRR data (-1 to +3 degrees 2Theta) for a SiC 6H 75mm diameter wafer, a reflection was observed at about 2 degree 2-Theta on the 2D detector as well as the XRR Omega-2Theta scan. The 25mm diameter 2D detector covered roughly 5 degree 2Theta at a sample-to-detector-distance (SDD) of about 140mm. Image attached summarizes the data in question. A Bruker D8 HRXRD instrument with a sealed tube x-ray generator along with Onsight Technology AXIS-TAS25 (Advanced XRD Imaging System) was employed to acquire the 3D XRD data (16Bit,
I intend to repeat these observations on the Rigaku Smartlab and a rotating anode x-ray generator soon!
I found the culprit and it wasn't the sample. I examined the incident beam and found the "ring" even without the sample. Most likely from the "doublet" in the HRXRD system past the beam conditioners visible due to a slit missing or miss-aligned. Will double check and fix :-)
I'll share data soon!
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