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Questions related from Ravi Ananth
Most of the XRD community is presently using 0D point counter or 1D linear PSD (position sensitive detector) in powder diffraction as well as rocking curve analyses. Any mention of the extinct...
03 December 2016 5,484 3 View
This data was acquired using the Onsight Technology AXIS (Advanced XRD Imaging System) 2D real time 27.5um pixel detector (25 mm diameter window) mounted on a Bruker D8 with Cu K Alpha, parabolic...
05 November 2016 4,452 4 View
Relative dislocation density using the approach of Hirsch et al. Dislocation Density, ρ = (β2)/(9.b2) b = Burgers Vector, andβ = Integrated Breadth (computed numerically from XRD profile data) Let...
20 September 2016 2,559 8 View
While collecting XRR data (-1 to +3 degrees 2Theta) for a SiC 6H 75mm diameter wafer, a reflection was observed at about 2 degree 2-Theta on the 2D detector as well as the XRR Omega-2Theta scan....
13 May 2016 8,639 2 View
XRR, X-ray Reflectivity or Reflectometry, is a NDE in situ method used to determine thin film dimensions and surface "flatness" for nearly a century now. What is the typical surface examination...
11 November 2015 4,631 14 View
i. How does one adjust for this type of sample displacement error (see figure in link below) with a conventional diffractometer measurement using the ubiquitous 0D Geiger counter (point...
16 November 2014 5,911 13 View
We have super high resolution (76um Pixel,
01 November 2014 5,497 15 View
0D or the conventional Geiger counter type detectors have been in use since the Braggs. How does this match up against the more modern 1D & 2D detectors? Let us say I'm using a high resolution...
12 July 2014 8,874 12 View
The X-ray Rocking Curve method has been perfected over the past half century to include the ability of examining homo-epitaxial and hetero-epitaxial structures. My interest would be in the...
27 February 2014 8,135 8 View
Quantifying the "preferred orientation" in an Aluminum foil (0.2mm) sample using 2D diffractograms obtained with transmission Laue geometry: Figure 1. 2D & 1D diffractograms compared, Al...
04 January 2014 376 9 View
In order to use XRD to measure the epi film thickness precisely, several conditions must be met including and not limited to: 1. The sample must be assumed optically flat which is invariably the...
08 December 2013 3,549 9 View
Bragg profile is also known as RCP-Rocking Curve Profile or RSP-Reciprocal Space Profile. Let us examine this difference between the substrate (usually CZ grown) and an epitaxial structure grown...
08 December 2013 947 10 View
Conventional XRD Pattern with a 0D point/scintillation detector/counter. We've used the diffraction pattern from the flat Aluminum holder as reference standard and shifted all the diffractograms...
08 March 2013 1,281 37 View
Image magnification with XRD using oblique angle of incidence on the detector: A unique method is proposed, with experimental evidence to substantiate, for magnifying topographic images using XRD....
01 January 1970 9,047 4 View
