For O1s, there are two peaks, 529.6ev and 533.3ev.
529.6ev can be corresponding to Zr-O. But 532.3ev, I don't know how to explain it.
Consult relevant literature, there are two explanations.
The first, It may be Si-O, but there is no Si element in my material.
The second, It may also be chemically adsorbed oxygen, but is this possible in ceramics materials?
I am puzzled by the analysis, hope I can get an answer about it.
Thank you
Dear! I think the peak which is detected at low binding eV is associated with the lattice oxygen of metal oxide, whereas the high binding eV peak is associated with the oxygen defects or oxygen of the surface.
Qiuan Sun
You can check for check for the O2- lattice species, the O- species that occur in the lattice to compensate charge deficiencies, and the OH- specie in your sample. Probably you have the three species on your sample.
I advise to read the following article, that discuss very well the oxygen species in metal oxides:
Systematic XPS studies of metal oxides, hydroxides and peroxides
https://pubs.rsc.org/en/content/articlelanding/2000/cp/a908800h
Dear Qiuan Sun.
To have an idea about the possible elements associated with the binding energy you mentioned, it would be necessary to know all the compounds involved in the synthesis process of your ZrO2-hBN compound. If you can provide this information I could help you with your question.
Simon Roa
Dear Simon Roa
I characterized my material by XRD. Results only face centered cubic zirconia and hexagonal boron nitride.
There is no mention of new phases in the literature I checked, so I think it is only ZrO2 and BN.
The sample was prepared by hot press sintering at 1400 ℃
Before XPS characterization, I polished and cleaned the samples.
Gustavo Henrique de Magalhães Gomes
Dear Professor
Thank you for your references. They are very helpful to me. Thank you very much.
According to the references, the strength of 532.3ev in my sample is too high.
So with reference to your comments and literature, I will test my sample again.
In your wide scan spectrum, do you see silicon (I note you say polished your pressed sample, many polishing compounds use Al or Si) - SO this may be attirbutable to silica
Otherwise would be useful to see your C1s spectrum as this may be organic (again perhaps from polishing?)
David J. Morgan
Dear Professor
Your suggestions are very important and helpful to me, thank you very much.
I rechecked my C1s spectrogram. Some organic matter is indeed present, but its corresponding intensity is very low. Similarly, I also re-compared the full XPS spectrum and did not detect Si.
Regarding the polishing, I used diamond sandpaper and performed 2-3 ultrasonic cleanings afterwards.
So I have re-prepared the sample in question and waiting for new test results.
Qiuan Sun when you say low intensity of the C1s organic peaks, how low? Remember XPS is about 3 times more sensitive to oxygen than it is to carbon, so will always look like there is more oxygen.
Be careful with the sandpaper too (even though ultrasoniced), many are not comprised of say Silica, but can be a zirconia-alumina compound, alumina or garnet (Silica related compound).
What are you ultrasonicating in? This could be be surface hydroxylation, although teh binding energy is rather high. I would still suspect organic and/or remnants from the polishing without seeing the wide scan spectrum
- Badges
- Science topic
- Similar topics
- Linguistics
- Composition Studies
- Publication