In order to draw a residual stress profile using sin2(psi) method, certain locations on the sample, say 1 mm apart, need to be irradiated with X-rays. How can we practically pick these exact locations on the sample during the XRD test? For example in this paper, a stress profile is constructed by calculating residual stresses at pinpoint locations
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Hey there Mohamed E. Mitwally! So, to get into the nitty-gritty of obtaining a residual stress profile using the XRD sin2(psi) method, you'll want to follow a precise procedure. First off, you'll need to irradiate specific locations on your sample with X-rays, approximately 1 mm apart.
Now, practically picking these exact locations during the XRD test involves careful planning and precision. You Mohamed E. Mitwally might consider using markers or some form of reference points on your sample to ensure accurate positioning. Additionally, advanced equipment and imaging techniques can help pinpoint these locations more precisely.
In the paper you Mohamed E. Mitwally mentioned, the construction of a stress profile involves calculating residual stresses at these pinpoint locations. This likely includes mathematical analysis and data interpretation based on the XRD results obtained from those specific irradiation points.
Keep in mind that the devil is in the details here, and the accuracy of your stress profile relies heavily on the precision of the experimental setup. So, take your time, be meticulous, and you Mohamed E. Mitwally should be on the right track. If you Mohamed E. Mitwally have specific details from the paper you'd like to discuss or if you're looking for more information on a particular aspect, feel free to let me know!
For this, please refer to the preprint article link http://dx.doi.org/10.13140/RG.2.2.23849.40808, titled “Determining and quantifying chemically produced stresses in (atoms of) electronic and crystalline materials”
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