The substrate material I have used to deposit the coatings is a Tungsten carbide tool insert. I have 2 coating variations: one with a monolayer of TiAlSiN and another with a bilayer of AlTiN/TiAlSiN. Each coating lies in the thickness range of 3-4 micrometers and has been deposited throughout the insert using PVD magnetron sputtering. I want to verify the coating thickness and with that study the microstructure at the cross-section. Previously when I used wire EDM to cut the monolayer insert, I observed a sort of coating folding/buckling, and could not get a precise reading on the thickness of the coating. After polishing the same, I wasn't even able to see the coating properly at the cross-section in the SEM. I have been thinking of using the method of brittle fracture combined with wire EDM. The insert will be cut up to 90% of the cross-section using wire EDM and brittle fractured after. This way, the fractured side can be polished and viewed under SEM. Is this method viable or are there any other better suggestions? If in case this method is viable, any suggestions on which method to use to brittle fracture the sample?

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