I have two GC/MS data-sets (positive and negative). About 2234 features have been detected by XCMS and 400 of them showed significant differences between those two groups.
Now, I need to identify the significant features. The problem is that I do not know how to integrate XCMS data to AMDIS. I have read somewhere that AMDIS takes these features from XCMS and can deconvolutes the data that can be used for NIST comparison.