Attached here is the XRd pattern of the ZnO seed layer. The peak is at a value of 2theta=32.96. Can anyone please help me to find the phase? Thanks so much for your help in advance.
We have used the p-Si as substrate. it has been confirmed that this peak does not belong to substrate (p-Si).
The process is to compare the experimental results with the ICSD or ASTM standard XRD data. The crystal phase and lattice parameters are written there. But the many standard data of a single phase are available in the library with little deference of Bragg angles and lattice parameters for the deposition techniques of a sample or some other causes. You should find the nearest one of the Bragg angles.
First confirm it is not silicon peak than using the theta and d values as shown below you can know the phase
d [A] 2Theta[deg]
2.81406 31.773 (100 phase)
2.60190 34.441 (002 phase)
2.47531 36.262 (101 phase)
Dear, you can be use the X-Pert high score 2008 program to analysis and getting on full data.
The shape of the peak suggests a contribution from the substrate or from an impurity that seems to have the charatceristic of a "single crystal". The peak is very sharp and a good separation between alpha1 and alpha2 seems present. The peak of ZnO is too far from your experimental one, there is about 1 degree that is justifiable only with a doping effect or a very high distortion of lattice parameters. Did you tried to determine the composition of your film? Are you sure that Zn and O are present on the substrate?
Dear Marcella, thank you very much for your guidance yes there is no impurity found in EDX, actually I have also got the growth of Zno nanorods with same seed layer conditions.Could you please have a look at the XRD pattern of the as grown nanorods. I am wondering why the peak not at the same angle (34.4) as is in case of nanorods. Thanks.
- Badges
- Science topic