I fabricated a Ni-based alloy specimen with C content in raw material less than 0.1%.
Theoretically, there were added some contaminations during the manufacturing process, but I'm unsure which amount. Is it possible to prove that no contaminations were added if EDS shows no C peaks?
I know that EDS can show a higher than real amount of C because of the contaminations on the specimen or in the device chamber, but if it shows me no carbon, does it mean I have no carbon?
And If so, is it better to use a lower voltage (e.g. 3-5eV) to detect such light elements?
In addition, may I truly compare the specimen with no contaminations and another with an unknown amount of contaminations and give a reliable answer about it (qualitatively, not quantitatively)?
Hi,
the short answer is No.
Normally, no quantitative analysis of C is performed by EDX. However, you can conclude the increasing or decreasing of carbon by studying the specimen before and after an %operation% (ceteris paribus) and discussing its nature. Nevertheless, a statement like “According to the EDX results the amount of Carbon on the surface after an %operation% decreased by X %mass due to contamination” would be wrong and you might be asked to confirm the results by other techniques. The presence and intensity of C peaks depend on many factors such as tilt, the position of the detector, distance and roughness. You may be faced with the same recommendation even if you perform accurately the process many times to collect statistics.
Sergei Egorov If your/any material is exposed to or stored in the atmosphere, it will be contaminated with carbon. Period. XPS will demonstrate the presence of substantial C on the surface of your/any material…. The only way to remove such a surface contamination is with Ar+ etching 10 - 15 atomic layers into the surface.
- Badges
- Science topic