Needed to detect a substance which is present at nanogram level on the surface of a polymer. Suggestions regarding the techniques other than the above mentioned would be appreciated.
Dear praveen for XPS and AFM, you can go to National physical laboratory, New delhi.
If you want to detect impurity in polymer surface with very less content (nano grams), AFM will not be useful. I don't think that XPS will also be useful due to the presence of carbon in the film. With carbon, it is difficult to get the signals of other elements.
You can look for secondary ion mass spectroscopy (SIMS), it is also present in NPL, New delhi. It will certainly help you to get the information of the surface.
I thank you for the information. You are right about AFM, but it is actually needed to study the surface morphology of the sample. Hope it is the right option for that. Another aim is to measure the exact concentration of a substance, used in a minute quantity to coat on a polymer. Should I proceed now with SIMS or is there any better option ? If YES, please inform me about its location.
Have you tried with EDX elemental analysis. I am not sure that very small quantities can be detected by it or not. But it is the widely used techniques to determine the elements inside a film. See this link for information.
You can have all these characterization in National Physical Laboratory, New Delhi. It is near CSIR complex. See this website for resources on characterization.
Hello pravin... did u get the source for x-ray photo spectro.??
Where is it and wht are charges..please share. We also require same to find presence of ligand on surface of polymeric nanoparticle. In our case the same entity is also entrapped inside so XRPS will work.