Often, XRD analysis of powdered carbon based materials, e.g. carbon blacks, are not reproducible (preparing the same sample different times for analysis), with a high variation of the S/N ratios, and different levels of background to be subtracted.
The latter problems make difficult to compare between different samples and draw more in depth conclusions about the effect of treatments, and so on.
I am currently using Si single crystal based sample holders with 0.2 mm depth, as recommended for carbon, due to its low X-Rays absorption coefficient making the reflected radiation coming from the inside of the sample.
Is there a standard way of preparing carbon based samples? How is it possible to improve the analysis reproducibility?