Z-scan technique is very powerful and simple in determining both the sign and magnitude of the nonlinear refractive index and the nonlinear absorption coefficient . The original Z-scan was proposed by Prof.Sheik- Bahae et al in 1989 identifying nonlinear coefficients and through a closed aperture Z-scan and an open aperture Z-scan1,2 . This method can be called transmittance based Z-scan. Since then, many variants of original Z-scan technique have been developed to enhance the sensitivity and signal-to-noise ratio. According Prof.T.Godin3, these variants can be categorized into 4 types: alteration of the input beam profiler4,5, theory optimization6, alteration of the detection system3,7-10 or modification of the original experimental setup11-14 .
However, when I read articles on the investigating third order nonlinear characteristics of material, the method often used is Z-scan method of Prof.Sheik- Bahae. Why these variants are not applicable and can not replace the original Z-scan?
Thank you and hoping for your insightful response.
1.M.Sheik-Bahae, A. A.Said, and E. W. Van Stryland, High-sensitivity, single-beam n2 measurements, Opt. Lett 14(17) (1989) 955-957.
2.P. B. Chapple, J. Staromlynska, J. A. Hermann, T. J. Mckay, R. G. Mcduff, Single-Beam Z-Scan: Measurement Techniques and Analysis, J. Nonlinear Optic. Phys. Mat, 6(3) (1997) 251-293.
3.T.Godin, M.Fromager, E.Cagniot, R.Moncorgé and K. Aït-Ameur, Baryscan: a sensitive and user-friendly alternative to Z scan for weak nonlinearities measurements. Opt. Lett, 36(8) (2011) 1401-1403.
4.W. Zhao and P. PalffyMuhoray, Zscan technique using tophat beams, Appl. Phys. Lett. 63 (1993) 1613.
5.S. Hughes and J. M. Burzler, Theory of Z-scan measurements using Gaussian-Bessel beams, Phys. Rev. A 56(1997) R1103.
6.R. E. Bridges, G. L. Fisher, and R. W. Boyd, Z-scan measurement technique for non-Gaussian beams and arbitrary sample thicknesses, Opt. Lett. 20(1995)1821.
7.T Xia, M Sheik-Bahae, AA Said, DJ Hagan, Z-scan and EZ-scan measurements of optical nonlinearities, J. Nonlinear Optic. Phys. Mat, 3(04) (1994) 489-500.
8.A. O. Marcano, H. Maillotte, D. Gindre, and D. Métin, Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing, Opt.Lett. 21(1996)101.
9.G.Boudebs, V.Besse, C.Cassagne, H.Leblond, and F.Sanchez, Why optical nonlinear characterization using imaging technique is a better choice?, In: Transparent Optical Networks (ICTON), 2013 15th International Conference on. IEEE ( 2013) 1-4.
10.G.Tsigaridas, M.Fakis, I.Polyzos, P.Persephonis and V.Giannetas, Z-scan technique through beam radius measurements, Appl. Phys. B 76(1)(2003) 83-86.
11.G. Boudebs and S. Cherukulappurath, Nonlinear optical measurements using a 4 f coherent imaging system with phase objects, Phys. Rev. A 69(2004) 053813.
12.D. V. Petrov, A. S. L. Gomes, and C. B. De Araujo, Reflection Z-scan technique for measurements of optical properties of surfaces, Appl.Phys. Lett. 65(1994)1067.
13.H. Ma and C. B. De Araujo, Two color Z-scan technique with enhanced sensitivity, Appl. Phys. Lett. 66(1995)1581.
14.A. A. Andrade, E. Tenorio, T. Catunda, M. L. Baesso, A. Cassanho, and H. P. Jenssen, Discrimination between electronic and thermal contributions to the nonlinear refractive index of SrAlF 5: Cr+ 3, J. Opt. Soc. Am. B 16(1999) 395.
Dear Lam Thanh Nguyen:
Thank you for your question, which has introduced me to the Z-Scan technology of which I have previously been completely ignorant. I don't have time to become an expert in your field, but I have just glanced at
http://dns2.asia.edu.tw/~ysho/YSHO-English/2000%20Engineering/PDF/IEE%20J%20Qua%20Ele26,%20760.pdf
My own impression is that as a scientist it is your job to pursue the answers to such questions you have asked by designing your own investigations to achieve the results you seek and to answer for yourself, to your own satisfaction, the questions related to which approaches give you the best information related to the knowledge you seek to gain about nature. Then, to tell others what you've learned and why you believe your work to be useful to others, whether or not your results have confirmed your initial suspicions or taught you some surprising things along the way.
I have never worried too much about doing things just as others do them routinely. Doing so would make a technologist out of this scientist. Try things out, modify your approaches to fit the need to satisfy your own curiosity, and celebrate the times when you learn something new and think that nobody has done that before.
Your "Why not ...?" makes me think that you may already know the answer to your own question! ;-)
I hope you often enjoy the feeling of success.
Sincerely, -Steve-
Dear Lam Thanh Nguyen:
Thank you for your question, which has introduced me to the Z-Scan technology of which I have previously been completely ignorant. I don't have time to become an expert in your field, but I have just glanced at
http://dns2.asia.edu.tw/~ysho/YSHO-English/2000%20Engineering/PDF/IEE%20J%20Qua%20Ele26,%20760.pdf
My own impression is that as a scientist it is your job to pursue the answers to such questions you have asked by designing your own investigations to achieve the results you seek and to answer for yourself, to your own satisfaction, the questions related to which approaches give you the best information related to the knowledge you seek to gain about nature. Then, to tell others what you've learned and why you believe your work to be useful to others, whether or not your results have confirmed your initial suspicions or taught you some surprising things along the way.
I have never worried too much about doing things just as others do them routinely. Doing so would make a technologist out of this scientist. Try things out, modify your approaches to fit the need to satisfy your own curiosity, and celebrate the times when you learn something new and think that nobody has done that before.
Your "Why not ...?" makes me think that you may already know the answer to your own question! ;-)
I hope you often enjoy the feeling of success.
Sincerely, -Steve-
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