Just by the statement of your question, it implies that you have more than a few layers, therefore it's not technically graphene.
If indeed you have graphene (even multi-layer), and you need to measure resistivity, I propose you do not use the 4-probe setup. Try instead AFM with a built-in IV probe.
The effect of pressure should be taken into account in studies of van der Waals forces in 2D heterostructures materials.Previous studies show that a strong van der Waals interaction between the graphene layer and the 2D substrate is expected under high pressure.
Graphite is simply stacked graphene layers,theroritically, equilibrium spacing ~ 3.35 Å for layer-to-layer carbon atom distance of graphite crystals, compressibility = 2.97 x 10-12 cm2 dyne-1 and exfoliation energy 42.6 meV.Practically 1-1.5 nm would be considered for single layer graphene(G) ,graphene oxide(GO) and reduced graphene oxide(rGO).
You can use either AFM or Raman spectroscopy to study the effect of pressure on thickness and then if Van der Waals forces causes restoring of stacking structures of graphite .
@debmalya sir, does there exist any threshold pressure which starts to affect interlayer distance?
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