Could you give more details about the deposited films? What is the thickness of your samples? Do they have similar morphology and structure? How did you determine the density?
It can be due to tensile or compressive strain induced on the film by the substrate. Hexagonal ZnO grow with the c axis perpendicular to the substrate, even for amorphous substrates as SiO2/Si(001) or glass, you can find a certain texture. In this last case, strain is observed as grain growth is achieved after nucleation. You can see which planes are submitted to tensile strain by XRD. Shift lo the left indicate tensile strain, which normaly is compensated to a right shift of some other peaks
How much is the difference in density you have found? Did you compare the density of films in the same substrate? How much is the experimental dispersión found in this last case?
As there is two different substrate. the grain size of them must be different.Depending upon the distribution of grains on the surface the density may vary.So it is essential to know the quality of substrate ,its grain size and distribution.
i deposited both substrates in one run. the variation within the samples of same substrate was very low. I used triplicates of each substrate to analyse the difference between the mean. the difference was statistically significant.