Very, very briefly. External morphology has no effect on the powder diffraction pattern at all (except for the possible effects of preferential orientation, i.e. texturing of the sample particles). The crystal structure (symmetry, cell size) primarily defines the positions of possible diffraction lines. The intensity of the lines is de facto determined by the density distribution in the given crystal structure.
The X-ray diffraction (XRD) intensity of a crystal is directly related to its crystal structure and morphology. The XRD intensity is a measure of the amount of diffracted X-ray radiation that is scattered from the crystal lattice. The intensity of the XRD pattern is determined by the number of atoms in the unit cell, the size of the unit cell, and the type of atoms in the unit cell. The morphology of the crystal also affects the XRD intensity, as the shape of the crystal can affect the amount of diffracted X-ray radiation that is scattered from the crystal lattice. In addition, the orientation of the crystal can also affect the XRD intensity, as the orientation of the crystal can affect the amount of diffracted X-ray radiation that is scattered from the crystal lattice.The size and shape of the crystallites also affect the XRD intensities, as smaller crystallites will scatter the X-rays more than larger crystallites.
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To get a sustainable solution to your problem, please refer to the preprint article given at link DOI: 10.13140/RG.2.2.27720.65287/3 or at link https://www.researchgate.net/publication/352830671.