what is the energy band change of mesoscopic perovskite solar cell using scanning Kelvin probe microscopy
Kelvin probe force microscopy measures the contact potential- or workfunction difference between a metal tip and the surface underneath. With additional illumination you can find the photoinduced potential, which tells you something about where in the cell charges are being generated. Generally, it works by compensating electrostatic forces between tip and sample using a bias voltage - so in principle it should not change anything in the sample. Generally, I would recommend frequency modulated (FM) KPFM methods because they are more quantitative and provide supirior resolution. We used it to look into perovskite solar cells: e.g. http://rdcu.be/Jc5B
Hello Ajli Li!
If you want to increase the resolution of your measurement in KPFM I want to recommend you to check this website:
https://next-tip.com/products/#product-2
Our technology is based on the coating of AFM tips with nanoparticles of controlled size and chemical composition. Thanks to the small size of the end of the tip (2 nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%).
While FM-KPFM indeed provides higher spatial resolution, AM-KPFM is more sensitive to small potential changes, so both have strong sides. However, it is possible to increase resolution on both FM and AM KPFM by simply wearing the tip apex into flat geometry as described in this article Article On the Origin of Extended Resolution in Kelvin Probe Force M...
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