The two methods are used for completely different purposes, so neither is "superior".

XRD examines the crystallinity of a sample. It tells you the crystal structure(s) of your sample, as well as the space group, lattice parameters, preferred orientation and crystallite size.

XPS examines the elemental composition of a sample. It tells you which elements are present in your sample, in which concentrations, and in which oxidation states.

For example, anatase and rutile will have similar XPS spectra (because they are both TiO2), but comparatively, they will have vastly different XRD patterns (because they have very different crystal structures). Conversely, when ZnO exists in the rocksalt crystal structure, its XRD pattern would be very similar to that of NaCl, but the two compounds' XPS spectra would be very different (because they are made up of completely different elements).

XRD is mainly used to determine - lattice parameter, internal stress/strain (elastic), coherently scattering domain size (crystallite size).

XPS is mainly used to determine - oxidation state, surface chemical composition.

Their field of application is non-overlapping, therefore can not be compared.

The two methods are used for completely different purposes, so neither is "superior".

XRD examines the crystallinity of a sample. It tells you the crystal structure(s) of your sample, as well as the space group, lattice parameters, preferred orientation and crystallite size.

XPS examines the elemental composition of a sample. It tells you which elements are present in your sample, in which concentrations, and in which oxidation states.

For example, anatase and rutile will have similar XPS spectra (because they are both TiO2), but comparatively, they will have vastly different XRD patterns (because they have very different crystal structures). Conversely, when ZnO exists in the rocksalt crystal structure, its XRD pattern would be very similar to that of NaCl, but the two compounds' XPS spectra would be very different (because they are made up of completely different elements).

X-ray diffraction is a non-destructive technique, used to identify the crystallographic information of your samples like crystal phase, composition, stress/strain and crystallite size. The intensity and position of the diffraction pattern are taken into an account for analyzing your sample. Usually electronic databases such as the Joint committee on powder diffraction standards (JCPDS) are employed for this comparison.

X-ray photoelectron spectroscopy (XPS) is a surface sensitive technique or normally called ESCA ( (Electron Spectroscopy for Chemical Analysis) ), used to study the electronic states and chemical composition of the surface of a sample.

Both are different.

Dear colleague Linto G Thomas,

Have a nice time and good day.

X-ray photoelectron spectroscopy (XPS) is used to check the chemical composition of your alloy or compound and identify the name of the elements but can't give you any information about the structure - amorphous, poly crystalline or crystalline and their parameters- of your alloy or compound. if you want to know that you should use X-Ray Diffraction, XRD technique.

I wish this is useful and help you.

Yours

A. El-Denglaawey

X-ray diffraction (XRD) is tecnique is used to study the crystallographic phases, lttice parameters, orientation, crytallinity, defects, crystallite size, bond length and strain etc. on the other hand, x-ray photoelectron spectroscopy is used to study the chemical states, binding energy, bonding information and stoichiometry of the elements of the compound(s).

What is difference between Bragg's Law of X ray diffraction and Einstein's photoelectric effect ?

I have a question :

How Cu - K alpha (8048 eV) in XRD is interaction with Bragg planes of a crystal and Al- K alpha (1486 eV) in XPS is interacting with the electronic levels of an atom?

Is this due to energy difference ?

Dear Sunita Kedia ,

I believe its the energy as you pointed out that does the difference. Because if you convert the Energy of the X-ray (in XRD) to the wavelength, it comes out to be the order of 10^-(10) A were as the XPS has much less energy which in turn implies has larger wavelength. So with larger wavelength, the simplest logic is that it can move over obstacles (considering lattice planes as the obstacles) hence will not be interacting. This can be wrong logic as well.