IN Both Conductive atomic force microscopy and Scanning tunneling spectroscopy technique I-V curve are detected. I want to know what is difference between them?
In simple words to understand: In C-AFM you have a direct contact of your tip and sample surface which allows you to perform electrical measurement as direct current transport while in case of STM, you don't have any direct contact between tip and surface and current conduction is done through quantum tunneling of carriers. In both methods, there is contact as ground to collect signal. There is also difference in the type of tips which is used for C-AFM and STM measurements.