Natale Perchiazzi I meant the "instrumental line broadening" factor that we need to subtract from sample FWHM to get the "Beta" value in the Scherrer equation. The "instrumental line broadening" is different for different instruments, so I wanted to know that for Bruker D8 XRD machine.
I suggest you to measure a NIST standard such LaB6 or Al2O3 in the same experimental conditions and near to 2theta angles of your unknown sample. That's the best approximation. Be careful with scherrer equation it's largely updated. I would prefer the rietveld approach