For example: We have prepared Solution of Zinc acetate in alcohol and we have added (doped) some % of silver in it and then deposited the solution in the form of a thin film on glass substrate, so how can I determine the % of silver deposited on thin film?
X-ray fluorescence spectroscopy would by my first choice for ease-of-use, analysis cost, and being able to find an instrument. Ratios of zinc to silver should be relatively easy to quantify using this method. You could also use energy dispersive X-ray spectroscopy. While I haven't tried to analyze something as large as a bulk film, in my nanoparticle work, utilizing STEM instruments a precise mapping of element locations can be achieved. In short you can see if you are getting dispersed silver or agglomerations of silver in your films.
As such it is not possible to get exact value by any technique in case of already prepared films.
Yes, we may have approximation based on
1. X-ray fluorescence spectroscopy
2. Energy dispersive X-ray spectroscopy
3. STEM
4. SEM probe based elemental analysis
Hi,
You can use XPS, EDAX in (SEM or TEM) UV-visible spectroscopy or can think of using ICP-MS or AAS.
Hi
I would recommend you to try the ICP-AES technique. It is a little be laborious, but at the end, you will get what you want.
Please, refer to this article:Thin Solid Films 517 (2009) 1546–1554
Good luck
Hi,
Let me add few cases that can be of interest.
Hall measurement is relatively simple and oftenly use.
If possible, you can also think of electrical measurements such as C(V) that allow you to get the doping of a thin film layer in an electrical devices.
If the layer is highly doped, you can do optical spectroscopy and look at the free carriers absorption in the IR region.
Best Regards
Species present in thin films are easily determined via XPS and XRD, but SEM and TEM analysis also can be employed.
If you have doping (1016-1019) - than SIMS if you have alloying (some at.%) - the methods suggested by some colleagues above.
I agree, XPS is a good technique but it is destructive, and I agree about SIMS with Daniela Gogova. XRF, PIXE techniques are also good but need good standard. My inclination is toward RBS which can detect from 1E14 atoms/ cm2 areal concentration for Ag.
Maybe you can use also spectroscopic ellipsomtry, but therefore you need a good model and you get the ratio out of the optical properties of the film.
Best regards
Christian
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