Repeatedly, I am getting a peak at around 26.5 (2 theta) in thin film sample (either impure phase or wurtzite structure) while I have changed most of the possible parameters in sputtering as well as heat treatment (300 to 575 degree C at different S vapor)
Please consider to simulate XRD pattern using softwares, such as VESTA and RIETAN.
In VESTA, the simulated data can be obtained by inputing CIF data of wurtzite CZTS if any. By comparing both measured and simulated patterns, the presence or absence of any phase can be evaluated.
Best regards.
In my opinion the following article will answer your question:
Suryawanshi, M.P., Agawane, G.L., Bhosale, S.M., Shin, S.W., Patil, P.S., Kim, J.H. and Moholkar, A.V., 2013. CZTS based thin film solar cells: a status review. Materials Technology, 28(1-2), pp.98-109.
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