We require another AFM/MFM for basic purposes such as step height measurements of 100s of nm, to small features of nm scale, as well as MFM. What make and models have you used that you would recommend?
The models by Asylum Research are outstanding. I have had personal experience with the MFP-3D and found it capable (tapping mode) of imaging monolayer steps on III:V materials, grown by MBE.
The Cypher S, also by Asylum Research, is capable of phenomenal resolution. I have not yet used the Cypher, but I look forward to doing so.
I cannot comment on other current models, but I hope you find this helpful.
Multiple AFM models can cover the applications you describe (step heights, MFM,..). Best choice will depend on the expected spatial resolution & sensitivity, step height accuracy & repeatability, sample size, importance of ease-of-use aspects, as well as any other future applications your team might have.
Note that AFM can be well suited to measure step heights of abrupt steps. Steps whcih have a more gradual & wider profile can be more challenging, as the small AFM (XY) range (typ < 100um) might not allow one to nicely scan a flat area on both the top & bottom surface of the step. For those type of steps, a stylus profiler can be a great alternative.
You are very welcome to visit our Singapore application lab to try out several AFM models (and/or stylus profiler) on some of your samples (with the help of one of our application scientists). Feel free to contact me off-list to arrange this.
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