If we are looking at an oxide film and want to measure its band gap, which of the two methods(xps/auger) will give us more information about the bulk and which will be more surface sensitive?
Tomasz Grzela
Hi,
In my opinion only XPS and its modifications (UPS, EELS etc.) will work here. Please be careful if You are thinking about optical band gap or to investigate real band structure of material.
I recommend older discussion on RG:
- https://www.researchgate.net/post/Can_we_measure_band_gap_using_xps
- https://www.researchgate.net/post/Is_there_any_recommended_way_to_measure_band_gap_and_fermi_level_of_wide_band_gap5eV_materials
And also great article:
Article Band offsets at κ-([Al,In] x Ga 1-x ) 2 O 3 /MgO interfaces
Regards
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